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Rastersondenmikroskopie: Atomare Skala Engineering durch Kräfte und Ströme: Neu-
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Neu
Neues, ungelesenes, ungebrauchtes Buch in makellosem Zustand ohne fehlende oder beschädigte Seiten. Genauere Einzelheiten entnehmen Sie bitte dem Angebot des Verkäufers.
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eBay-Artikelnr.:282828826196
Artikelmerkmale
- Artikelzustand
- Book Title
- Scanning Probe Microscopy: Atomic Scale Engineering by Forces and
- Publication Date
- 2006-06-28
- Pages
- 282
- ISBN
- 9780387400907
- Subject Area
- Technology & Engineering, Science
- Publication Name
- Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents
- Publisher
- Springer New York
- Item Length
- 9.3 in
- Subject
- Nanoscience, Materials Science / General, Electron Microscopes & Microscopy, Nanotechnology & Mems
- Publication Year
- 2006
- Series
- Nanoscience and Technology Ser.
- Type
- Textbook
- Format
- Hardcover
- Language
- English
- Item Weight
- 46.2 Oz
- Item Width
- 6.1 in
- Number of Pages
- Xiv, 282 Pages
Über dieses Produkt
Product Identifiers
Publisher
Springer New York
ISBN-10
0387400907
ISBN-13
9780387400907
eBay Product ID (ePID)
48248759
Product Key Features
Number of Pages
Xiv, 282 Pages
Language
English
Publication Name
Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents
Subject
Nanoscience, Materials Science / General, Electron Microscopes & Microscopy, Nanotechnology & Mems
Publication Year
2006
Type
Textbook
Subject Area
Technology & Engineering, Science
Series
Nanoscience and Technology Ser.
Format
Hardcover
Dimensions
Item Weight
46.2 Oz
Item Length
9.3 in
Item Width
6.1 in
Additional Product Features
Intended Audience
Scholarly & Professional
LCCN
2005-936713
Dewey Edition
22
Number of Volumes
1 vol.
Illustrated
Yes
Dewey Decimal
502.8/2
Table Of Content
The Physics of Scanning Probe Microscopes.- SPM: The Instrument.- Theory of Forces.- Electron Transport Theory.- Transport in the Low Conductance Regime.- Bringing Theory to Experiment in SFM.- Topographic images.- Single-Molecule Chemistry.- Current and Force Spectroscopy.- Outlook.
Synopsis
Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today's simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will understand how simulations can be directly compared to experimental data. Key Features Serves as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopy Provides a framework for linking scanning probe theory and simulations with experimental data Written in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations, Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today's simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today's research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.
LC Classification Number
TA418.5-.84
Artikelbeschreibung des Verkäufers
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