Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM.
Produktkennzeichnungen
Herausgeber
Harald Fuchs, Sumio Hosaka, Bharat Bhushan
ISBN-10
3540005277
ISBN-13
9783540005278
eBay Product ID (ePID)
4337666
Produkt Hauptmerkmale
Sprache
Englisch
Anzahl der Seiten
500 Seiten
Verlag
Springer Berlin Heidelberg, Springer Berlin
Publikationsname
Applied Scanning Probe Methods I
Autor
Harald Fuchs, Sumio Hosaka, Bharat Bhushan
Format
Gebundene Ausgabe
Erscheinungsjahr
2004
Zusätzliche Produkteigenschaften
Hörbuch
No
Inhaltsbeschreibung
Hc Runder Rücken Kaschiert
Item Length
24cm
Item Height
3cm
Item Width
16cm
Item Weight
1kg
Buchreihe
Nanoscience And Technology
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