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RASTERMIKROSKOPIE FÜR NANOTECHNOLOGIE: TECHNIKEN UND von Weilie Zhou & Zhong-
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eBay-Artikelnr.:187334485517
Artikelmerkmale
- Artikelzustand
- Gut
- Hinweise des Verkäufers
- ISBN-10
- 0387333258
- Book Title
- Scanning Microscopy for Nanotechnology: Techniques and
- Genre
- Nanotechnology
- ISBN
- 9780387333250
Über dieses Produkt
Product Identifiers
Publisher
Springer New York
ISBN-10
0387333258
ISBN-13
9780387333250
eBay Product ID (ePID)
52760327
Product Key Features
Number of Pages
Xiv, 522 Pages
Language
English
Publication Name
Scanning Microscopy for Nanotechnology : Techniques and Applications
Publication Year
2006
Subject
Materials Science / General, Nanoscience, Electron Microscopes & Microscopy, Nanotechnology & Mems
Type
Textbook
Subject Area
Technology & Engineering, Science
Format
Hardcover
Dimensions
Item Height
0.4 in
Item Weight
38.3 Oz
Item Length
9.3 in
Item Width
6.1 in
Additional Product Features
Intended Audience
Scholarly & Professional
Dewey Edition
22
Number of Volumes
1 vol.
Illustrated
Yes
Dewey Decimal
502.825
Table Of Content
Fundamentals of Scanning Electron Microscopy (SEM).- Backscattering Detector and EBSD in Nanomaterials Characterization.- X-ray Microanalysis in Nanomaterials.- Low kV Scanning Electron Microscopy.- E-beam Nanolithography Integrated with Scanning Electron Microscope.- Scanning Transmission Electron Microscopy for Nanostructure Characterization.- to In-Situ Nanomanipulation for Nanomaterials Engineering.- Applications of FIB and DualBeam for Nanofabrication.- Nanowires and Carbon Nanotubes.- Photonic Crystals and Devices.- Nanoparticles and Colloidal Self-assembly.- Nano-building Blocks Fabricated through Templates.- One-dimensional Wurtzite Semiconducting Nanostructures.- Bio-inspired Nanomaterials.- Cryo-Temperature Stages in Nanostructural Research.
Synopsis
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists., Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.
LC Classification Number
T174.7
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- 8***g (253)- Bewertung vom Käufer.Letzte 6 MonateBestätigter KaufA smooth and professional transaction throughout. The item was exactly as described, clearly listed, and fairly priced. Communication from the seller was prompt, polite, and helpful, with dispatch confirmed quickly. The parcel was securely packaged and arrived in excellent condition, ahead of the expected delivery date. Care was taken at every stage of the process. I would be happy to buy from this seller again—many thanks for a reliable and well-handled sale.FINLAND AND EUROPE: INTERNATIONAL CRISES IN THE PERIOD OF By Juhani Paasivirta (Nr. 335694307643)
- 0***t (10)- Bewertung vom Käufer.Letzter MonatBestätigter KaufItem was exactly as described and packaged to protect it. Seller’s pricing was spot on and when I received it, it was in good condition. Seller actually messaged me when they shipped it (I really appreciated that). Overall I’m happy doing business with them!
- t***s (44)- Bewertung vom Käufer.Letzte 6 MonateBestätigter KaufThe Item itself I rate five stars. The seller, however, I stop at four stars. The seller met two out of three categories I look for when judging my purchasing experience: how well it was packaged, how quickly it was shipped, and how properly it was described; this seller provided prompt shipping and an accurate description, but failed when it came to packaging. The item arrived in a plastic bag without any reinforcement or protection whatsoever and suffered dinged corners on multiple fronts.