This book explores novel representations and comparison tools for analyzing structures and irregularities in signals and images. In opposition to most methods, the ideas introduced here work at the pixel-level. Structures and irregularities are studied using approaches that stem from discrepancy theory, functional analysis and potential theory, and low-level signal processing. In particular we show that structure enhancing similarity measures or representations have advantages over usual tools for image comparison and analysis.
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Südwestdeutscher Verlag für Hochschulschriften AG Co. KG